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Trademark
Owner
Trademark: NanoFrazor 2457719
Word
NanoFrazor
ID
2457719
Trademark Type
WORD
Status
Published: Awaiting examination
Application Date
26 March 2024
Owner(s)
Heidelberg Instruments Mikrotechnik GmbH
Service
Goods and Services:
Class 7
:
Machines and machine tools for microelectronics, microsystems technology, semiconductor and nanotechnology
;
machines for the production of electronic components and optical and technical devices
;
precision machines and spare parts for these machines
;
lithography systems, consisting of lithography machines, lithography devices and lithography components
;
nanolithography systems, consisting of nanolithography machines, nanolithography devices and nanolithography components
;
thermal scanning probe lithography systems, consisting of thermal scanning probe lithography machines, thermal scanning probe lithography devices and thermal scanning probe lithography components
;
lithography systems for direct structuring of substrates, consisting of lithography machines, lithography devices and lithography components
;
grayscale lithography systems, consisting of grayscale lithography machines, grayscale lithography devices and grayscale lithography components.
Class 9
:
Apparatus and instruments for scientific research in laboratories
;
scientific apparatus and instruments for microelectronics, microsystems technology, semiconductor and nanotechnology
;
measuring devices, electrical, photographic, optical, measuring, signaling and monitoring devices, in particular for precision systems in microelectronics, microsystems technology, semiconductor and nanotechnology
;
peripheral devices for computers
;
data processing units, data processing devices and computers
;
recorded and downloadable media
;
computer software
;
electrical systems for remote-controlled industrial operations
;
electrical systems [control systems] for production plants in microelectronics, microsystems technology, semiconductor and nanotechnology
;
measuring instruments
;
measuring devices
;
material testing instruments and machines
;
apparatus and instruments for physics
;
precision measuring apparatus
;
projectors
;
probes for scientific purposes
;
tips, probes, needles, cantilevers and transducers for scanning probe microscopes
;
scanning probe microscopes
;
atomic force microscopes
;
heater for scanning probe microscopes
;
topography sensors
;
electroacoustic actuators.