Trademark: TESCAN ORSAY 1735660
Word
TESCAN ORSAY
ID
1735660
Trademark Type
Word
Status
Protected: Registered/protected
Application Date
17 June 2015
Registration Date
17 June 2015
Renewal Date
17 June 2025
Owner(s)
Service
Pipers
Goods and Services:
Class 7:
Electrical devices and machine tools for the manufacture of semiconductor parts, displays, data storage components, and objects for scientific research use, namely, electron and ion columns, namely, focused electron beam columns for electron lithography, electron beam microscopy and analysis, focused ion beam columns for ion lithography, imaging, and ion milling, secondary ion mass spectrometry; accessories for the above mentioned electrical devices and machine tools for use in the manufacture of semiconductor parts, displays, data storage components, and objects for scientific research use, such as, sample preparation equipment, namely equipment for preparation of samples to be machined or analysed by some of the above mentioned devices and machine tools
Electrical devices and machine tools for the manufacture of semiconductor parts, displays, data storage components, and objects for scientific research use, namely, electron and ion columns, namely, focused electron beam columns for electron lithography, electron beam microscopy and analysis, focused ion beam columns for ion lithography, imaging, and ion milling, secondary ion mass spectrometry; accessories for the above mentioned electrical devices and machine tools for use in the manufacture of semiconductor parts, displays, data storage components, and objects for scientific research use, such as, sample preparation equipment, namely equipment for preparation of samples to be machined or analysed by some of the above mentioned devices and machine tools
Class 9:
Microscopes, namely, electron microscopes, scanning electron microscopes, transmission electron microscopes, ion microscopes, raman microscopes, atomic force microscopes, holographic microscopes; scientific apparatus, namely electron sources for microscopes; scientific apparatus in the nature of ion sources for microscopes, namely, liquid-metal ion sources and plasma sources; focused ion beam tools and electron beam tools, namely, instruments for material deposition and removal and for imaging, analysis, and measurement of materials in the fields of microscopy and nanotechnology; optical apparatus, namely, electron beam lithography device; scientific instruments, namely, particle analyzers and classification instruments in the field of mineralogy; spectrometry scientific apparatus and instruments, namely, time-of-flight secondary ion mass spectrometry systems, X-ray and visible light spectrometry systems; lasers for nonmedical purposes; optical apparatus and instruments, namely, optical prisms, optical lenses, optical fibres, optical cables, optical mirrors; diaphragms for scientific apparatus; measuring instruments, namely, micrometer gauges; parts and fittings for all the aforesaid goods, namely, electron and ion detectors for electron and ion beam systems, electron detectors, secondary ions detectors, back scattered electron detectors, X-ray detectors, cathodoluminiscence detectors; parts and fittings for all the aforesaid scientific instruments namely, diffraction apparatus and diffraction detectors for microscopes, electron multipliers, photo multipliers, amplifiers, gas injection systems, electron flood guns, stages and nanomanipulators for microscopes, decontaminators, vacuum systems and gauges; microscopic system navigational software, namely, software that enhances the navigational, functional capability of microscopic, analytic, lithographic and spectroscopic components separately and/or in integrated systems; application software and operation system software for operation of all the foregoing equipment separately and/or in integrated systems, namely, software for use in microscopic imaging, milling, deposition and analysis; image processing software
Microscopes, namely, electron microscopes, scanning electron microscopes, transmission electron microscopes, ion microscopes, raman microscopes, atomic force microscopes, holographic microscopes; scientific apparatus, namely electron sources for microscopes; scientific apparatus in the nature of ion sources for microscopes, namely, liquid-metal ion sources and plasma sources; focused ion beam tools and electron beam tools, namely, instruments for material deposition and removal and for imaging, analysis, and measurement of materials in the fields of microscopy and nanotechnology; optical apparatus, namely, electron beam lithography device; scientific instruments, namely, particle analyzers and classification instruments in the field of mineralogy; spectrometry scientific apparatus and instruments, namely, time-of-flight secondary ion mass spectrometry systems, X-ray and visible light spectrometry systems; lasers for nonmedical purposes; optical apparatus and instruments, namely, optical prisms, optical lenses, optical fibres, optical cables, optical mirrors; diaphragms for scientific apparatus; measuring instruments, namely, micrometer gauges; parts and fittings for all the aforesaid goods, namely, electron and ion detectors for electron and ion beam systems, electron detectors, secondary ions detectors, back scattered electron detectors, X-ray detectors, cathodoluminiscence detectors; parts and fittings for all the aforesaid scientific instruments namely, diffraction apparatus and diffraction detectors for microscopes, electron multipliers, photo multipliers, amplifiers, gas injection systems, electron flood guns, stages and nanomanipulators for microscopes, decontaminators, vacuum systems and gauges; microscopic system navigational software, namely, software that enhances the navigational, functional capability of microscopic, analytic, lithographic and spectroscopic components separately and/or in integrated systems; application software and operation system software for operation of all the foregoing equipment separately and/or in integrated systems, namely, software for use in microscopic imaging, milling, deposition and analysis; image processing software
Class 37:
Service, maintenance and repair of microscopes, namely, electron microscopes, scanning electron microscopes, transmission electron microscopes, ion microscopes, raman microscopes, atomic force microscopes, holographic microscopes; service, maintenance and repair of scientific apparatus, namely, electron sources for microscopes, ion sources for microscopes, namely, liquid-metal ion sources and plasma sources; service, maintenance and repair of focused ion beam tools and electron beam tools, namely, instruments for material deposition and removal and for imaging, analysis, and measurement of materials in the fields of microscopy and nanotechnology; service, maintenance and repair of electron beam lithography apparatus; service, maintenance and repair of particle analyzers and classification instruments in the field of mineralogy; service, maintenance and repair of spectrometry systems, namely, time-of-flight secondary ion mass spectrometry systems, X-ray and visible light spectrometry systems; service, maintenance and repair of lasers and optical apparatus and instruments, namely, optical prisms, optical lenses, optical fibres, optical cables, optical mirrors; service, maintenance and repair of diaphragms for scientific apparatus; service, maintenance and repair of measuring instruments, namely, micrometer gauges; service, maintenance and repair of detectors for electron and ion beam systems, electron detectors, secondary ions detectors, back scattered electron detectors, X-ray detectors, cathodoluminiscence detectors; service, maintenance and repair of diffraction apparatus and diffraction detectors for microscopes, electron multiplier tubes, photo multipliers, amplifiers, gas injection systems, electron flood guns, stages and nanomanipulators for microscopes, decontaminators, vacuum systems and gauges
Service, maintenance and repair of microscopes, namely, electron microscopes, scanning electron microscopes, transmission electron microscopes, ion microscopes, raman microscopes, atomic force microscopes, holographic microscopes; service, maintenance and repair of scientific apparatus, namely, electron sources for microscopes, ion sources for microscopes, namely, liquid-metal ion sources and plasma sources; service, maintenance and repair of focused ion beam tools and electron beam tools, namely, instruments for material deposition and removal and for imaging, analysis, and measurement of materials in the fields of microscopy and nanotechnology; service, maintenance and repair of electron beam lithography apparatus; service, maintenance and repair of particle analyzers and classification instruments in the field of mineralogy; service, maintenance and repair of spectrometry systems, namely, time-of-flight secondary ion mass spectrometry systems, X-ray and visible light spectrometry systems; service, maintenance and repair of lasers and optical apparatus and instruments, namely, optical prisms, optical lenses, optical fibres, optical cables, optical mirrors; service, maintenance and repair of diaphragms for scientific apparatus; service, maintenance and repair of measuring instruments, namely, micrometer gauges; service, maintenance and repair of detectors for electron and ion beam systems, electron detectors, secondary ions detectors, back scattered electron detectors, X-ray detectors, cathodoluminiscence detectors; service, maintenance and repair of diffraction apparatus and diffraction detectors for microscopes, electron multiplier tubes, photo multipliers, amplifiers, gas injection systems, electron flood guns, stages and nanomanipulators for microscopes, decontaminators, vacuum systems and gauges