Trademark: INDU TECH 1245646
Word
INDU TECH
ID
1245646
Trademark Type
Fancy
Status
Protected: Registered/protected
Application Date
16 January 2008
Registration Date
16 January 2008
Renewal Date
16 January 2028
Owner(s)
Service
Refer to WIPO address for Correspondence
Goods and Services:
Class 9:
Measuring instruments, process measuring instruments, measuring instruments for the determination of the physical properties of solids, liquids, suspensions, gases and aerosols, namely measuring instruments for elemental analysis, measuring instruments for the determination of moisture, measuring instruments for the determination of ash content, measuring instruments for density measurement, measuring instruments for the determination of the concentration of defined substances, namely of water, alcohol, fat, protein, acetone, carbon, measuring instruments for the determination of consistency and turbid density, measuring instruments for the measurement of mass flow, measuring instruments for the measurement of layer thickness, measuring instruments for the measurement of basis weight, parts of the aforementioned goods, X-ray tubes, radiation detectors, microwave generators, microwave receivers, ultrasonic generators, ultrasonic receivers, nuclear radiation sources, lasers; computer software for the operation of the aforementioned measuring instruments
Measuring instruments, process measuring instruments, measuring instruments for the determination of the physical properties of solids, liquids, suspensions, gases and aerosols, namely measuring instruments for elemental analysis, measuring instruments for the determination of moisture, measuring instruments for the determination of ash content, measuring instruments for density measurement, measuring instruments for the determination of the concentration of defined substances, namely of water, alcohol, fat, protein, acetone, carbon, measuring instruments for the determination of consistency and turbid density, measuring instruments for the measurement of mass flow, measuring instruments for the measurement of layer thickness, measuring instruments for the measurement of basis weight, parts of the aforementioned goods, X-ray tubes, radiation detectors, microwave generators, microwave receivers, ultrasonic generators, ultrasonic receivers, nuclear radiation sources, lasers; computer software for the operation of the aforementioned measuring instruments