Trademark: UE MICRO-EPSILON 1685124
Word
UE MICRO-EPSILON
Device Descrption:
GREEK CHARACTERS,MU & EPSILON ARE LTRS UE; ELLIPSE EXTENDS FROM LTR E
ID
1685124
Trademark Type
Figurative
Status
Protected: Renewal due
Application Date
06 August 2014
Registration Date
06 August 2014
Renewal Date
06 August 2024
Service
Griffith Hack
Goods and Services:
Class 9:
Electronic checking (supervision), measuring, signalling, regulating, controlling, monitoring, switching, metering and power supply devices and apparatus; electric and electronic sensors; sensors and measuring systems and installations for contact and non-contact measurement of geometric parameters (path, distance, length, position, diameter, thickness and surface); sensors and measuring systems and installations, being capacitive, magnetic, inductive, optical and confocal, using electromagnetic wave frequency, triangulation, an eddy current, an optical micrometer, a light section, image processing or a cable; sensors and measuring systems and installations for non-contact measurement of temperature; sensors and measuring systems and installations for non-contact measurement of colour, texture, gloss or degree of gloss of surfaces or colours, intensity and frequency of light waves; technical endoscopes; spectrometers; testing apparatus for detection of defects, flaws or shape deviations of surfaces; sensors and measuring systems and installations for non-contact measurement of speed; sensors and measuring systems and installations for gas analysis, in particular via infrared spectroscopy; computer software and hardware, in particular for signal processing, evaluation of measured quantities, image processing, surface inspection and calibration of sensors and sensor systems
Electronic checking (supervision), measuring, signalling, regulating, controlling, monitoring, switching, metering and power supply devices and apparatus; electric and electronic sensors; sensors and measuring systems and installations for contact and non-contact measurement of geometric parameters (path, distance, length, position, diameter, thickness and surface); sensors and measuring systems and installations, being capacitive, magnetic, inductive, optical and confocal, using electromagnetic wave frequency, triangulation, an eddy current, an optical micrometer, a light section, image processing or a cable; sensors and measuring systems and installations for non-contact measurement of temperature; sensors and measuring systems and installations for non-contact measurement of colour, texture, gloss or degree of gloss of surfaces or colours, intensity and frequency of light waves; technical endoscopes; spectrometers; testing apparatus for detection of defects, flaws or shape deviations of surfaces; sensors and measuring systems and installations for non-contact measurement of speed; sensors and measuring systems and installations for gas analysis, in particular via infrared spectroscopy; computer software and hardware, in particular for signal processing, evaluation of measured quantities, image processing, surface inspection and calibration of sensors and sensor systems